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Tehranipoor, Mohammad

Emerging Nanotechnologies: test, defect tolerance, and reliability by Mohammad Tehranipoor - New York Springer 2008 - xii, 405p.

Contents:
Section 1 Test and Defect Tol

ISBN: 038774746X

Subjects--Topical Terms:
Nanotechnology

Dewey Class. No.: 621.381 TEH

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