Nicolici, Nicola
Power Constrained Testing of VLSI Circuits by Nicola Nicolici - Boston Kluwer Academic Publishers 2003 - xi, 178p.: ill.; 25 cm.
Table Of Contents:
1. Design and Test o
140207235X
Semiconductors -- Thermal properties
Integrated circuits -- Very large scale integration -- Protection
Integrated circuits -- Very large scale integration -- Testing
621.395 NIC
Power Constrained Testing of VLSI Circuits by Nicola Nicolici - Boston Kluwer Academic Publishers 2003 - xi, 178p.: ill.; 25 cm.
Table Of Contents:
1. Design and Test o
140207235X
Semiconductors -- Thermal properties
Integrated circuits -- Very large scale integration -- Protection
Integrated circuits -- Very large scale integration -- Testing
621.395 NIC