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Chim, Wai Kin

Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy Wai Kin Chim - Singapore John Wiley & Sons 2000 - xv, 269p.

ISBN: 047149240X

Subjects--Topical Terms:
Semiconductors -- Microscopy
Semiconductors -- Testing
Semiconductors -- Failures
Photon emission

Dewey Class. No.: 621.38152 CHI

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