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Sachdev, Manoj

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev - 2nd ed. - New Delhi Springer (India) Pvt Ltd 2007 - xxi, 328 p.

Table of Contents:

1. Introd

ISBN: 9788184894295

Subjects--Topical Terms:
VLSI circuits

Dewey Class. No.: 621.395 SAC

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