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Tan, Cher Ming

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Cher Ming Tan - New York Springer 2011 - vii, 150p.

ISBN: 9780857293091

Subjects--Topical Terms:
Reliability (Engineering)
Finite element method
Integrated circuits - Ultra large scale integration

Dewey Class. No.: 621.395 TAN

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