OPAC_KOHA catalog › ISBD view

Normal view MARC view ISBD view

Tehranipoor, Mohammad H

Nanometer Technology Designs: high-quality delay tests Mohammad Tehranipoor - New York, NY Springer Verlag, Netherlands 2008 - xvii, 281p.

ISBN: 9780387764863

Subjects--Topical Terms:
Nanotechnology
Integrated circuits - Very large scale integration
Integrated circuits - Testing

Dewey Class. No.: 621.381548 TEH

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)