Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Record no. 61042)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00504nam a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180620b2004 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 1402077521 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 004.53 HAM |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Hamdioui, Said |
| 245 ## - TITLE STATEMENT | |
| Title | Testing Static Random Access Memories: Defects, Fault Models and Test Patterns |
| Statement of responsibility, etc. | Said Hamidoui |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Boston |
| Name of publisher, distributor, etc. | Kluwer Academic Publishers |
| Date of publication, distribution, etc. | 2004 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xx, 221p. |
| 365 ## - TRADE PRICE | |
| Price type code | .00 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Random Access Memories -- Testing |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
| a | 2dca7c697f0000010117f12aa35eb40f |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Serial Enumeration / chronology | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| REFERENCE SECTION | LRC_JUIT | LRC_JUIT | Computer Science & Engineering | 05/03/2010 | Krishna Book Distributors | 6171.53 | Copy 1 | REF 004.53 HAM | 020297 | 21/05/2019 | 21/05/2019 | REFERENCE BOOK |