VLSI Test Principles and Architectures : design for testability (Record no. 61207)
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000 -LEADER | |
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fixed length control field | 00565nam a2200181Ia 4500 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 180620b2006 xxu||||| |||| 00| 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0123705975 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.395 WAN |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Personal name | Wang, Laung Terng |
245 ## - TITLE STATEMENT | |
Title | VLSI Test Principles and Architectures : design for testability |
Statement of responsibility, etc. | Edited by Laung Terng Wang |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | San Francisco |
Name of publisher, distributor, etc. | Morgan Kaufmann Publishers |
Date of publication, distribution, etc. | 2006 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xxiii, 777p. |
365 ## - TRADE PRICE | |
Price type code | .00 |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Computer architecture |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Wen, Xiaoqing |
700 ## - ADDED ENTRY--PERSONAL NAME | |
Personal name | Wu, Cheng-Wen |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
a | 2dccd0f77f0000010063dee8412a1aaf |
Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Serial Enumeration / chronology | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
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REFERENCE SECTION | LRC_JUIT | LRC_JUIT | Electronics & Communication Engineering | 05/03/2010 | Book World India; Delhi | 1998.50 | Copy 1 | REF 621.395 WAN | 016854 | 21/05/2019 | 21/05/2019 | REFERENCE BOOK |