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Nanometer Technology Designs: high-quality delay tests (Record no. 63307)

000 -LEADER
fixed length control field	00616nam a2200181Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	180620b2008 xxu\|\|\|\|\| \|\|\|\| 00\| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	9780387764863
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number	621.381548 TEH
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name	Tehranipoor, Mohammad H
245 ## - TITLE STATEMENT
Title	Nanometer Technology Designs: high-quality delay tests
Statement of responsibility, etc.	Mohammad Tehranipoor
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc.	New York, NY
Name of publisher, distributor, etc.	Springer Verlag, Netherlands
Date of publication, distribution, etc.	2008
300 ## - PHYSICAL DESCRIPTION
Extent	xvii, 281p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Nanotechnology
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Integrated circuits - Very large scale integration
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Integrated circuits - Testing
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name	Ahmed, Nisar
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a	b72a5b18ac1049190092d6d7a61b05d3

Holdings
Withdrawn status	Lost status	Damaged status	Not for loan	Collection code	Home library	Current library	Shelving location	Date acquired	Source of acquisition	Cost, normal purchase price	Serial Enumeration / chronology	Total Checkouts	Full call number	Barcode	Date last seen	Price effective from	Koha item type
				REFERENCE SECTION	LRC_JUIT	LRC_JUIT	Physics	22/09/2011	Krishna Book Distributors	4936.73	Copy 1		REF 621.381548 TEH	027085	21/05/2019	21/05/2019	REFERENCE BOOK