Fault Tolerance and Reliability Techniques for High-Density Random-Access Memories Kanad Chakraborty

By: Chakraborty, KanadContributor(s): Mazumder, PinakiMaterial type: TextTextPublication details: Washington Prentice Hall 2002Description: xix, 426pISBN: 8120322142Subject(s): Semiconductor circuits | Random Access Memories -- Testing | Circuit DesignDDC classification: 621.3815 CHA
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
TEXT BOOK TEXT BOOK LRC_JUIT
Electronics & Communication Engineering 		TEXTBOOK SECTION 621.3815 CHA (Browse shelf (Opens below)) Copy 1 Available 021728
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