High Resolution X-Ray Scattering: from thin films to lateral Nanostructures by Ullrich Pietsch

By: Pietsch, UllrichMaterial type: TextTextPublication details: Berlin Springer Verlag 0Description: 408pSubject(s): X-rays -- Diffraction | X-rays -- Scattering | thin films -optical properties | Nanostructured materialsDDC classification: 530.4175 PIE
Contents:
http://www.springer.com/0-387-40092-3 C
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Physics 		REFERENCE SECTION REF 530.4175 PIE (Browse shelf (Opens below)) Copy 1 Not for loan 013787
Total holds: 0

http://www.springer.com/0-387-40092-3
C

There are no comments on this title.

to post a comment.

Library Home | Contact Us | LRC Help

Copyright @ 2020 LRC
Jaypee University of Information Technology
website hit counter

Powered by Koha