Introduction to Semiconductor Devices: for computing and telecommunications applications by Kevin F. Brennan
Material type:
TextPublication details: London Cambridge University Press 2005Description: xvii, 316pISBN: 0521670365Subject(s): Semiconductor DevicesDDC classification: 621.38152 BRE
Contents:
<p><strong>Table of Contents:</strong><
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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TEXT BOOK
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LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 BRE (Browse shelf (Opens below)) | Copy 1 | Available | 012200 | ||
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TEXT BOOK
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LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 BRE (Browse shelf (Opens below)) | Copy 2 | Available | 016606 | ||
REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.38152 BRE (Browse shelf (Opens below)) | Copy 3 | Not for loan | 016607 | ||
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TEXT BOOK
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LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 BRE (Browse shelf (Opens below)) | Copy 4 | Available | 025975 |
Total holds: 0
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| REF 621.38152 AME ESD in Silicon Integrated Circuits | REF 621.38152 BAC Fabrication of Gas Devices | REF 621.38152 BAL Advanced Power Rectifier Concepts | REF 621.38152 BRE Introduction to Semiconductor Devices: for computing and telecommunications applications | REF 621.38152 BRY Optics of Quantum Dots and Wires | REF 621.38152 CAP Bulk Crystal Growth of Electronic, Optical and Optoelectronic Materials | REF 621.38152 CHI Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy |
<p><strong>Table of Contents:</strong><
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