Linear Models for Optimal Test Design by Wim J van der Linden
Material type:
TextPublication details: New York Springer 2005Description: xxiii, 408pISBN: 0387202722Subject(s): Psychometrics | Linear models (Statistics)DDC classification: 150.287 LIN
Contents:
Contents:
1. Brief History of Test Theo
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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REFERENCE BOOK
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LRC_JUIT Other | REFERENCE SECTION | REF 150.287 LIN (Browse shelf (Opens below)) | Copy 1 | Not for loan | 021238 |
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| REF 003.85 PIN System Identification : a frequency domain approach | REF 025.04 MAN Introduction to information retrieval | REF 025.0654 BAN Chemical Information Mining: facilitating literature-based discovery | REF 150.287 LIN Linear Models for Optimal Test Design | REF 152.14 MII Computational Maps in the Visual Cortex | REF 291.43 BHA Mosaic of Faith: places of worship in india | REF 300.15195 COO Data Envelopment Analysis: A Comprehensive Text with Models, Applications, References and DEA-Solver Software |
Contents:
1. Brief History of Test Theo
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