Principles of Semiconductor Devices by Sima Dimitrijev
Material type: TextPublication details: New York Oxford University Press 2005Description: xviii, 588pISBN: 0195687841Subject(s): SemiconductorsDDC classification: 621.38152 DIM
Contents:
Table of Contents
Pt. I Introduction to
Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 1 | Available | 015868 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 2 | Available | 015869 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 3 | Available | 015870 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 4 | Available | 015871 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 5 | Available | 015872 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 6 | Available | 016729 | ||
TEXT BOOK | LRC_JUIT Electronics & Communication Engineering | TEXTBOOK SECTION | 621.38152 DIM (Browse shelf (Opens below)) | Copy 7 | Available | 016730 |
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621.38152 CHI Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy | 621.38152 CHI Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy | 621.38152 DIM Principles of Semiconductor Devices | 621.38152 DIM Principles of Semiconductor Devices | 621.38152 DIM Principles of Semiconductor Devices | 621.38152 DIM Principles of Semiconductor Devices | 621.38152 DIM Principles of Semiconductor Devices |
Table of Contents
Pt. I Introduction to
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