Semiconductor Memories: technology testing and reliability by Ashik K. Sharma
Material type:
TextPublication details: New Delhi: Prentice Hall, 1997Description: xii, 462pISBN: 8120316835; 9788120316836Subject(s): SemiconductorDDC classification: 004.53 SHA
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds |
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TEXT BOOK
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LRC_JUIT Computer Science & Engineering | TEXTBOOK SECTION | 004.53 SHA (Browse shelf (Opens below)) | Copy 1 | Available | 000688 | ||
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TEXT BOOK
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LRC_JUIT Computer Science & Engineering | TEXTBOOK SECTION | 004.53 SHA (Browse shelf (Opens below)) | Copy 2 | Available | 000689 |
Total holds: 0
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