Extended Defects in Semiconductors: electronic properties, device effects and structures by D.B. Holt, B.G. Yacobi.
Material type:
TextPublication details: Cambridge ; New York Cambridge University Press 2007Description: xi, 631pISBN: 9780521819343Subject(s): Semiconductors - DefectsDDC classification: 621.38152 HOL
Contents:
<p>Table of contents:<br />
Chapter 1.
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.38152 HOL (Browse shelf (Opens below)) | Copy 1 | Not for loan | 025918 |
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| REF 621.38152 GIL Low-Dimensional Nitride Semiconductors | REF 621.38152 HEN Dilute Nitride Semiconductors | REF 621.38152 HOD Chemical Solution Deposition of Semiconductor Films | REF 621.38152 HOL Extended Defects in Semiconductors: electronic properties, device effects and structures | REF 621.38152 HON Nanoscale Phenomena in Ferroelectric Thin Films | REF 621.38152 KIM Introductory Quantum Mechanics for Semiconductor Nanotechnology | REF 621.38152 LEI Devices for Optoelectronics |
<p>Table of contents:<br />
Chapter 1.
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