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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev

By: Sachdev, ManojContributor(s): Pineda de Gyvez, JoseMaterial type: Text

TextPublication details: New Delhi Springer (India) Pvt Ltd 2007Edition: 2nd edDescription: xxi, 328 pISBN: 9788184894295Subject(s): VLSI circuitsDDC classification: 621.395 SAC

Contents:

Table of Contents: 1. Introd

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Item type	Current library	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
TEXT BOOK	LRC_JUIT Electronics & Communication Engineering	TEXTBOOK SECTION	621.395 SAC (Browse shelf (Opens below))	Copy 1	Available		024904
TEXT BOOK	LRC_JUIT Electronics & Communication Engineering	TEXTBOOK SECTION	621.395 SAC (Browse shelf (Opens below))	Copy 2	Available		025254

Total holds: 0

Table of Contents:

1. Introd

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