Novel Algorithms for Fast Statistical Analysis of Scaled Circuits by Amith Singhee
Material type:
TextPublication details: London Springer Verlag, Netherlands 2009Description: xv, 195pISBN: 9789048130993Subject(s): Integrated circuits -- Computer-aided design | Novel Algorithms for Fast Statistical Analysis of Scaled CircuitsDDC classification: 621.381 SIN
Contents:
<p>Contents:</p>
<p>1. SiLVR: projecti
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.381 SIN (Browse shelf (Opens below)) | Copy 1 | Not for loan | 024429 |
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| REF 621.381 SEC Solid-State Microwave High -Power Amplifiers | REF 621.381 SED Post-Processing Techniques for Integrated MEMS | REF 621.381 SET Electroceramic-Based Mems fabrication-technology and applications | REF 621.381 SIN Novel Algorithms for Fast Statistical Analysis of Scaled Circuits | REF 621.381 SON Optimal Observation for Cyber-physical Systems: a fisher-information-matrix-based approach | REF 621.381 TAY Materials and Process Integration for MEMS | REF 621.381 TEH Emerging Nanotechnologies: test, defect tolerance, and reliability |
<p>Contents:</p>
<p>1. SiLVR: projecti
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