RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors by Jianjun Gao
Material type:
TextPublication details: Raleigh SciTech Publishing 2010Description: x, 339pISBN: 9781891121890Subject(s): field-effect transistors - Testing | Compound Semiconductors- TestingDDC classification: 621.3815 GAO
Contents:
<p>Contents:</p>
<p>1. Representation
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.3815 GAO (Browse shelf (Opens below)) | Copy 1 | Not for loan | 024432 |
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| REF 621.3815 ESM Advanced Simulation Methods for ESD Protection Development | REF 621.3815 FUH Sequential Optimization of Asynchronous and Synchronous Finite State Machines | REF 621.3815 FUL Rapid IO: the embedded system interconnect | REF 621.3815 GAO RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors | REF 621.3815 GEB Networks-on-Chips: Theory and Practice | REF 621.3815 GIA Baseband Analog Circuits for Software Defined Radio | REF 621.3815 HAA Low-frequency Noise in advanced MOS Devices |
<p>Contents:</p>
<p>1. Representation
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