Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices Edited by Josef Sikula
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TextPublication details: London Kluwer Academic Publishers 2003Description: ix, 367pISBN: 1402021690Subject(s): Noise Research | Nanotechnology -- Congress | Electronic noise -- CongressesDDC classification: 621.38224 SIK
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.38224 SIK (Browse shelf (Opens below)) | Copy 1 | Not for loan | 015476 |
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| REF 621.38224 MAR Controlling Radiated Emissions by Design | REF 621.38224 OTT Electromagnetic Compatibility Engineering | REF 621.38224 PAU Transmission Lines in Electronic Systems for EMC Practitioners | REF 621.38224 SIK Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices | REF 621.38224 TIH Electromagnetic Compatibility in Power Electronics | REF 621.38224 VAS Electronic Noise and Interfering Signals: principles and applications | REF 621.38224 WIC Error Control Systems for Digital Communications and Storage |
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