Advanced Production Testing of RF, SoC, and SiP Devices Joe Kelly
Material type:
TextPublication details: Bostan Artech House 2007Description: xx, 301pISBN: 158053709XSubject(s): Systems on a chip -- Testing | Radio frequencyDDC classification: 621.3815 KEL
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
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REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.3815 KEL (Browse shelf (Opens below)) | Copy 1 | Not for loan | 021288 |
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| REF 621.3815 HUF High Dielectric Constant Materials : VLSI MOSFET applications | REF 621.3815 HUS Model Engineering in Mixed-Signal Circuit design: a guide to generating accurate behavioral models in VHDL-AMS | REF 621.3815 KAB Fault Diagnosis of Analog Integrated Circuits | REF 621.3815 KEL Advanced Production Testing of RF, SoC, and SiP Devices | REF 621.3815 KLI Semiconductor and Metal Nanocrystals : synthesis and electronic and optical properties edited by Victor I. Klimov | REF 621.3815 KUL Electronic Circuit Design: from concept to implementation | REF 621.3815 LEE Subband Adaptive Filtering: Theory and Implementation |
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