VLSI Test Principles and Architectures : design for testability Edited by Laung Terng Wang

By: Wang, Laung TerngContributor(s): Wen, Xiaoqing | Wu, Cheng-WenMaterial type: TextTextPublication details: San Francisco Morgan Kaufmann Publishers 2006Description: xxiii, 777pISBN: 0123705975Subject(s): Computer architectureDDC classification: 621.395 WAN
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Electronics & Communication Engineering 		REFERENCE SECTION REF 621.395 WAN (Browse shelf (Opens below)) Copy 1 Not for loan 016854
Total holds: 0

There are no comments on this title.

to post a comment.

Library Home | Contact Us | LRC Help

Copyright @ 2020 LRC
Jaypee University of Information Technology
website hit counter

Powered by Koha