Nanometer Technology Designs: high-quality delay tests Mohammad Tehranipoor
Material type: TextPublication details: New York, NY Springer Verlag, Netherlands 2008Description: xvii, 281pISBN: 9780387764863Subject(s): Nanotechnology | Integrated circuits - Very large scale integration | Integrated circuits - TestingDDC classification: 621.381548 TEHItem type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
REFERENCE BOOK | LRC_JUIT Physics | REFERENCE SECTION | REF 621.381548 TEH (Browse shelf (Opens below)) | Copy 1 | Not for loan | 027085 |
Total holds: 0
Browsing LRC_JUIT shelves, Shelving location: Physics, Collection: REFERENCE SECTION Close shelf browser (Hides shelf browser)
REF 621.38152 TAK Wide Bandgap Semiconductors: fundamental properties and modern photonic and electronic devices | REF 621.38152 WET Metal Based Thin Films for Electronics | REF 621.3815422 WU Fundamentals of Liquid Crystal Devices | REF 621.381548 TEH Nanometer Technology Designs: high-quality delay tests | REF 621.395 DIA Advanced Nanoscale ULSI Interconnects: fundamentals and applications | REF 660.283 LAL Chemical Sensors and Biosensors | REF 667.9 ALI Nanocoatings: size effect in nanostructured films |
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