Analog and Mixed Signal Test by Bapiraju Vinnakota
Material type:
TextPublication details: Washington Prentice Hall 1998Description: xix, 261pISBN: 0137863101Subject(s): Mixed signal circuits - testing | Linear Integrated CircuitsDDC classification: 621.3815 VIN
Contents:
Includes bibliographical references and
| Item type | Current library | Collection | Call number | Vol info | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
REFERENCE BOOK
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LRC_JUIT Electronics & Communication Engineering | REFERENCE SECTION | REF 621.3815 VIN (Browse shelf (Opens below)) | Copy 1 | Not for loan | 006494 |
Total holds: 0
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| REF 621.3815 TAY Electronic Composites | REF 621.3815 VAS Computational Electronics: semiclassical and quantum device modeling and simulation | REF 621.3815 VAS Effective Functional Verification: principles and processes | REF 621.3815 VIN Analog and Mixed Signal Test | REF 621.3815 VOL ESD: physics and devices | REF 621.3815 WAG Pulse Code Modulation Systems Design | REF 621.3815 WAN Analog Filters Using MATLAB |
Includes bibliographical references and
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