TY  - BOOK
AU  - Tehranipoor, Mohammad
TI  - Emerging Nanotechnologies: test, defect tolerance, and reliability
SN  - 038774746X
U1  - 621.381 TEH 
PY  - 2008///
CY  - New York
PB  - Springer
KW  - Nanotechnology
N1  - Contents:
Section 1 Test and Defect Tol
ER  -