TY  - BOOK
AU  - Amerasekera, Ajith E.
AU  - Najm, Farid N.
TI  - Failure Mechanisms in Semiconductor Devices
SN  - 0471954829
U1  - 621.381521 AME 
PY  - 1997///
CY  - Singapore
PB  - John Wiley & Sons
KW  - Semiconductors-failures
ER  -