TY  - BOOK
AU  - Brandon, David
AU  - Kaplan, Wayne D.
TI  - Microstructural Characterization of Materials
SN  - 0470027851
U1  - 620.1199 BRA 
PY  - 2008///
CY  - England
PB  - John Wiley & Sons
KW  - Microstructure
KW  - Materials - Microscopy
N1  - Table of Contnts;
1. The Concept of Mic
ER  -