Nicolici, Nicola <br/><br/>
Power Constrained Testing of VLSI Circuits 
by Nicola Nicolici 
 - Boston  Kluwer Academic Publishers  2003 
 - xi, 178p.: ill.; 25 cm. 
<br/><br/>Table Of Contents:<br/>1. Design and Test o 
<br/><br/><label>ISBN: </label>140207235X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors -- Thermal properties<br/>Integrated circuits -- Very large scale integration -- Protection<br/>Integrated circuits -- Very large scale integration -- Testing
<br/><br/><label>Dewey Class. No.: </label>621.395 NIC