TY  - BOOK
AU  - Nicolici, Nicola
AU  - Al-Hashimi, Bashir M.
TI  - Power Constrained Testing of VLSI Circuits
SN  - 140207235X
U1  - 621.395 NIC 
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Semiconductors -- Thermal properties
KW  - Integrated circuits -- Very large scale integration -- Protection
KW  - Integrated circuits -- Very large scale integration -- Testing
N1  - Table Of Contents:
1. Design and Test o
ER  -