David, Rene <br/><br/>
Random Testing of Digital Circuits: theory and applications 
Rene David 
 - New York  Marcel Dekker Inc.   1998 
 - xix,475p. 
<br/><br/><label>ISBN: </label>0824701828 
<br/><br/><label>Subjects--Topical Terms: </label><br/>digital integrated circuits-testing.
<br/><br/><label>Dewey Class. No.: </label>621.3815 DAV