Chim, Wai Kin <br/><br/>
Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy 
Wai Kin Chim 
 - Singapore  John Wiley & Sons  2000 
 - xv, 269p. 
<br/><br/><label>ISBN: </label>047149240X 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors -- Microscopy<br/>Semiconductors -- Testing<br/>Semiconductors -- Failures<br/>Photon emission
<br/><br/><label>Dewey Class. No.: </label>621.38152 CHI