TY  - BOOK
AU  - Chim, Wai Kin
TI  - Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy
SN  - 047149240X
U1  - 621.38152 CHI 
PY  - 2000///
CY  - Singapore
PB  - John Wiley & Sons
KW  - Semiconductors -- Microscopy
KW  - Semiconductors -- Testing
KW  - Semiconductors -- Failures
KW  - Photon emission
ER  -