Sachdev, Manoj <br/><br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 
by Manoj Sachdev 
 - 2nd ed. 
 - New Delhi  Springer (India) Pvt Ltd  2007 
 - xxi, 328 p. 
<br/><br/><p>Table of Contents:</p><br/><br/><p>1. Introd 
<br/><br/><label>ISBN: </label>9788184894295 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI circuits
<br/><br/><label>Dewey Class. No.: </label>621.395 SAC