TY  - BOOK
AU  - Sachdev, Manoj
AU  - Pineda de Gyvez, Jose
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SN  - 9788184894295
U1  - 621.395 SAC 
PY  - 2007///
CY  - New Delhi
PB  - Springer (India) Pvt Ltd
KW  - VLSI circuits
N1  - <p>Table of Contents:</p>

<p>1. Introd
ER  -