Agarwal, Yash <br/><br/>
Pattern and Anomaly Recognition in Industrial Scenarios 
by Yash Agarwal 
 - Solan    Jaypee University of Information Technology  2017 
 - vi, 48p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Science Engineering 
<br/><br/><label>Dewey Class. No.: </label>SPR 005 AGA