TY  - BOOK
AU  - Gao, Jianjun
TI  - RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors
SN  - 9781891121890
U1  - 621.3815 GAO 
PY  - 2010///
CY  - Raleigh
PB  - SciTech Publishing
KW  - field-effect transistors - Testing
KW  - Compound Semiconductors- Testing
N1  - <p>Contents:</p>

<p>1. Representation
ER  -