Huisman, Leendert M <br/><br/>
Data Mining and Diagnosing IC fails 
Leendert M Huisman 
 - New York  Springer  2005 
 - xix, 270p. 
<br/><br/><label>ISBN: </label>0387249931 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Data Mining
<br/><br/><label>Dewey Class. No.: </label>006.321 HUI