Hamdioui, Said <br/><br/>
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns 
Said Hamidoui 
 - Boston  Kluwer Academic Publishers  2004 
 - xx, 221p. 
<br/><br/><label>ISBN: </label>1402077521 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Random Access Memories -- Testing
<br/><br/><label>Dewey Class. No.: </label>004.53 HAM