TY  - BOOK
AU  - Hamdioui, Said
TI  - Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
SN  - 1402077521
U1  - 004.53 HAM 
PY  - 2004///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Random Access Memories -- Testing
ER  -