TY  - BOOK
AU  - Jha, Niraj K.
AU  - Gupta, Sandeep
TI  - Testing of Digital Systems
SN  - 0521773563
U1  - 621.381548 JHA 
PY  - 2003///
CY  - London
PB  - Cambridge University Press
KW  - digital integrated circuits-testing
ER  -