Wang, Laung Terng <br/><br/>
VLSI Test  Principles and Architectures : design for testability 
Edited by Laung Terng Wang 
 - San Francisco  Morgan Kaufmann Publishers  2006 
 - xxiii, 777p. 
<br/><br/><label>ISBN: </label>0123705975 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer architecture
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN