TY  - BOOK
AU  - Wang, Laung Terng
AU  - Wen, Xiaoqing
AU  - Wu, Cheng-Wen
TI  - VLSI Test  Principles and Architectures : design for testability
SN  - 0123705975
U1  - 621.395 WAN 
PY  - 2006///
CY  - San Francisco
PB  - Morgan Kaufmann Publishers
KW  - Computer architecture
ER  -