TY  - BOOK
AU  - Tan, Cher Ming
AU  - Hou, Yuejin
AU  - Gan, Zhenghao
AU  - Li, Wei
TI  - Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
SN  - 9780857293091
U1  - 621.395 TAN 
PY  - 2011///
CY  - New York
PB  - Springer
KW  - Reliability (Engineering)
KW  - Finite element method
KW  - Integrated circuits - Ultra large scale integration
ER  -