TY  - BOOK
AU  - Claeys, Cor L
AU  - Simoen, E
TI  - Extended Defects in Germanium: fundamental and technological aspects
SN  - 9783540856115
U1  - 620.1892 CLA 
PY  - 2009///
CY  - Berlin
PB  - Springer Verlag, Netherlands
KW  - Electrical Engineering
KW  - Semiconductors - Defects
KW  - Germanium
ER  -