TY  - BOOK
AU  - Tehranipoor, Mohammad H
AU  - Ahmed, Nisar
TI  - Nanometer Technology Designs: high-quality delay tests
SN  - 9780387764863
U1  - 621.381548 TEH 
PY  - 2008///
CY  - New York, NY
PB  - Springer Verlag, Netherlands
KW  - Nanotechnology
KW  - Integrated circuits - Very large scale integration
KW  - Integrated circuits - Testing
ER  -