OPAC_KOHA catalog › Results of search for 'ccl=su:"Semiconductors -- Defects"'

Your search returned 4 results.

	1.	Theory of Defects in Semiconductors by David A. Drabold by Drabold, David A \| Estreicher, Stefan K. Material type: Text Publication details: Berlin Springer Verlag 2007Availability: Items available for reference: Not for loanCall number: REF 621.38152 DRA (1). : Request article Add to cart (remove)
	2.	Extended Defects in Semiconductors: electronic properties, device effects and structures by D.B. Holt, B.G. Yacobi. by Holt, D. B \| Yacobi, B. G. Material type: Text Publication details: Cambridge ; New York Cambridge University Press 2007Availability: Items available for reference: Not for loanCall number: REF 621.38152 HOL (1). : Request article Add to cart (remove)
	3.	Gettering Defects in Semiconductors by V.A. Perevostchikov by Perevostchikov, V. A \| Skupov, V. D. Material type: Text Publication details: Berlin Springer Verlag, Netherlands 2005Availability: Items available for reference: Not for loanCall number: REF 621.38152 PER (1). : Request article Add to cart (remove)
	4.	Extended Defects in Germanium: fundamental and technological aspects Cor Claeys by Claeys, Cor L \| Simoen, E. Material type: Text Publication details: Berlin Springer Verlag, Netherlands 2009Availability: Items available for reference: Not for loanCall number: REF 620.1892 CLA (1). : Request article Add to cart (remove)