OPAC_KOHA catalog › Results of search for 'ccl=su:"Semiconductors -- Failures"'

Your search returned 2 results.

	1.	Failure Mechanisms in Semiconductor Devices E. Ajith Amerasekera. by Amerasekera, Ajith E \| Najm, Farid N. Edition: 2nd.Material type: Text Publication details: Singapore John Wiley & Sons 1997Availability: Items available for reference: Not for loanCall number: REF 621.381521 AME (1). : Request article Add to cart (remove)
	2.	Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy Wai Kin Chim by Chim, Wai Kin. Material type: Text Publication details: Singapore John Wiley & Sons 2000Availability: Items available for loan: Call number: 621.38152 CHI (2). Items available for reference: Not for loanCall number: REF 621.38152 CHI (1). Place hold Request article Add to cart (remove)