OPAC_KOHA catalog › Results of search for 'ccl=su:"Semiconductors -- Testing"'

Your search returned 2 results.

	1.	Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy Wai Kin Chim by Chim, Wai Kin. Material type: Text Publication details: Singapore John Wiley & Sons 2000Availability: Items available for loan: Call number: 621.38152 CHI (2). Items available for reference: Not for loanCall number: REF 621.38152 CHI (1). Place hold Request article Add to cart (remove)
	2.	RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors by Jianjun Gao by Gao, Jianjun. Material type: Text Publication details: Raleigh SciTech Publishing 2010Availability: Items available for reference: Not for loanCall number: REF 621.3815 GAO (1). : Request article Add to cart (remove)