Nanometer Technology Designs: high-quality delay tests Mohammad Tehranipoor

By: Tehranipoor, Mohammad HContributor(s): Ahmed, NisarMaterial type: TextTextPublication details: New York, NY Springer Verlag, Netherlands 2008Description: xvii, 281pISBN: 9780387764863Subject(s): Nanotechnology | Integrated circuits - Very large scale integration | Integrated circuits - TestingDDC classification: 621.381548 TEH
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Physics 		REFERENCE SECTION REF 621.381548 TEH (Browse shelf (Opens below)) Copy 1 Not for loan 027085
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