Random Testing of Digital Circuits: theory and applications Rene David

By: David, ReneMaterial type: TextTextPublication details: New York Marcel Dekker Inc. 1998Description: xix,475pISBN: 0824701828Subject(s): digital integrated circuits-testingDDC classification: 621.3815 DAV
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Electronics & Communication Engineering 		REFERENCE SECTION REF 621.3815 DAV (Browse shelf (Opens below)) Copy 1 Not for loan 007995
Total holds: 0

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